Beilstein J. Nanotechnol.2015,6, 420–427, doi:10.3762/bjnano.6.42
; amplitude modulation; atomic force microscopy; fluidborneexcitation; interferometric detection; laser-beam detection; spurious resonances; Introduction
Dynamic atomic force microscopy (AFM) was introduced in the late 1980s [1] as the natural evolution of the first atomic force microscopes [2]. Thanks to
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Figure 1:
Setup employed for the direct excitation of the tip. A gold coated optical fiber is used to measure...